Course SEM & Microanalysis
Fundamentals of scanning electron microscopy (SEM) and microanalysis (energy-dispersive X-ray spectrometry, EDS), including sample preparation and coating techniques
This is a compact entry-level course, held in English and suited for people with no or little experience in electron microscopy (corresponding to level R1/R2).
Scanning electron microscopy (SEM) and microanalysis with energy-dispersive X-ray spectrometry (EDS) has become a state-of-the-art technique to study a variety of samples.
During this compact course, the basic principles of scanning electron microscopy and microanalysis as well as operating procedures will be communicated through lectures, demonstrations and practical exercises on the newest available instruments provided specifically by the different manufacturers for the courses in Münster.
- Operating principles of scanning electron microscopes:
vacuum system, different types of electron guns, electron path through the column / electron optics, electron beam – specimen interactions, imaging signals: secondary and backscattered electrons, scanning and image formation
- SEM operating procedure:
optimizing electron gun settings, beam alignment (apertures, wobble adjustment, astigmatism), working distance, magnification, depth of field and focusing
- Principles of energy-dispersive X-ray spectrometry (EDS):
X-ray production and interaction volume, operating principle of an EDS detector, qualitative and quantitative element analysis, spectrum artefacts, mapping
- Sample preparation and coating techniques
- Optimizing analytical parameters depending on the task (i.e., imaging or microanalysis) and sample type:
accelerating voltage, working distance, beam current
- Avoiding typical operating errors
A folder with detailed documentation of the topics covered in the course will be provided.
The participant will receive a certificate proving the participation in the course.
You can bring your own samples for imaging and for performing EDS analyses.
scientific and technical staff from industry, research institutes, universities or government agencies, who want to expand their knowledge and gain more practical expertise in scanning electron microscopy and microanalysis.
Priv.- Doz. Dr. P. F. Schmidt
Dr. Jana Bergholtz
March 6th - March 10th 2017
08:30am to 1:15pm and 2:15pm - 5:30pm
Friday until 4:00pm
University of Applied Sciences
1.870,- EUR (VAT free)
The course fee includes: a folder with detailed documentation of the topics covered in the course, lunch as well as beverages and snacks served during the breaks (every day) and one dinner social.
Akademie für Elektronenmikroskopie und Analytik gemeinnützige GmbH
Please use our online form for your registration:
Alternatively you're welcome to register for this training course by mail or fax (don't forget to mention the name/number of the course):
Register for the course by mail, phone, fax or email:
Priv.- Doz. Dr. rer. nat. P. F. Schmidt
Akademie für Elektronenmikroskopie und Analytik gGmbH
A certificate of attendance will be issued to all participants.
For the registration to the SEM & Microanalysis course please indicate the type of SEM and EDS analytical device, on which you work or will work. We need this information for the organization into the working groups. Own samples can be examined.
After your registration, training course information (confirmation, exact map reference and calculation) will be send to you.
Room bookings for the training course we ask to give up directly:
- Stadt Münster
- Münster Marketing
- D-48127 Münster
- Tel.: +49 251/492-2726
- Fax: +49 251/492-7759
- e-mail: email@example.com
- Web: www.marketing.muenster.de
Minor changes in the program may occur. The organizers are not liable for any damages or losses that occur in circumstances related to the completion of the course. If the course cannot be held, registration fees that have been paid will be refunded. Any further claims are excluded.